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Thin Film Measurement System For Single And Multilayer Film Structures

FEATURES:
● Real-time Spectral Capture and Instrument control for Reflectance and/or Transmittance
● Includes Large Library of Materials Data
● Supports multilayer, freestanding, rough, and both thick and thin layer structures
● New materials can be easily added by measuring corresponding sample or importing data from file
● Supports Parameterized materials : Cauchy, Sellmeir, EMA (effective-medium approximation), Harmonic oscillator, Tauc-Lorentz oscillator, Drude-Lorentz
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TF-VIS

Wavelength Range (nm) : 400-1000nm

  •  RANGE  400-1000 nm
     RESOLUTION  <2 nm
     THICKNESS  150A-20 um
     LAMP TYPE  Halogen SL1

     

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TF-C-UVIS

Wavelength Range (nm) : 190-850nm

  •  RANGE  190-850 nm
     RESOLUTION  <2 nm
     THICKNESS  50A-20 um
     LAMP TYPE  Deuterium SL3

     

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TF-C-UVIS-SR

Wavelength Range (nm) : 220-1100nm

  •  RANGE  220-1100 nm
     RESOLUTION  <2.5 nm
     THICKNESS  50A-20 um
     LAMP TYPE  SL 1-F+ SL 3

     

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TF-NIR

Wavelength Range (nm) : 900-1700nm

  •  RANGE  900-1700 nm
     RESOLUTION  <5 nm
     THICKNESS  1000A-200 um
     LAMP TYPE  Halogen SL1

     

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TF-VIS-NIR

Wavelength Range (nm) : 400-1700nm

  •  RANGE  400-1700 nm
     RESOLUTION  <2 nm, 5>1000
     THICKNESS  150A-200 um
     LAMP TYPE  Halogen SL1

     

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TF-C-UVIS-SRN

Wavelength Range (nm) : 200-1700nm

  •  RANGE  200-1700 nm
     RESOLUTION  <2 nm, 5>1000
     THICKNESS  50A-200 um
     LAMP TYPE  Hal+Deut SL4

     

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Stellar Net ’s Thin Film measurement Systems Ideal For :
● Solar PV Films (TFPVs) including thin silicon, II-VI (primarily CdTe), CIGS, TCO stacks, and polymides.
● On-line thickness measurements of oxides, silicon nitride and many other semiconductor process films.
● In-situ measurement during MEMS patterning processes used to measure thick photoresist uniformity & thickness.
● Hardcoat measurements to measure thickness of protective films in the automotive and avia tion industries.
● StellarNet Systems are also typical in coating measurement applications.
● Measure LCD & OLED displays, cell gaps
● The thickness of rough layers on substrates such as steel, aluminum, brass, copper, ceramics and plastics ITO & polyamide structures.