SID4


Spectral Range VIS – NIR (400 – 1100 nm)

Our entry-level yet high-resolution wavefront sensor covering the visible and NIR range, the SID4 is the perfect versatile tool for any laser or optical metrology application

Key Features

  • High sensitivity – 2 nm RMS
  • Achromaticity from 400 – 1100 nm without calibration
  • Self-referenced – insensitive to vibrations & easy to align

PHASICS

Spec

SID4
ModelSID4
Wavelength range400 – 1100 nm
Aperture dimension5.02 x 3.75 mm²
Spatial resolution27.6 µm
Phase & intensity sampling182 x 136 (> 24 000 points)
Resolution (Phase)< 2 nm RMS
Accuracy10 nm RMS
Acquisition rate60 fps
Real-time processing frequency*10 fps (full resolution)
Computer connectionGiga Ethernet
Dimensions (W x H x L)62 x 64 x 94 mm³
Weight~ 450 g
*with SID4 Software
Download
Brochure-Laser-testing-and-adaptive-optics-solutions-V10.pdf
Brochure-Optical-metrology-solutions-Kaleo-products-V9.pdf
SID4-Specifications-Sheet-V3.pdf