SID4 eSWIR


Spectral Range SWIR (900 – 1700 nm) eSWIR (1.7 – 2.35 µm)

The SID4 eSWIR wavefront sensor integrates Phasics’ patented technology with a T2SL detector and is the only high-resolution wavefront sensor covering the extended SWIR range from 0.9 to 2.35 µm. SID4 eSWIR is an innovative solution for testing SWIR sources and lenses used in optical communications, inspection instruments, or night vision in military and surveillance devices.

 Key Features

  • Extended spectral range from 0.9 to 2.35 µm
  • High resolution – 80 x 64 phase pixels
  • Compact and self-referenced for easy setup

PHASICS

Spec

SID4 eSWIR
ModelSID4 eSWIR
Wavelength range0.9 – 2.35 µm
Aperture dimension9.60 x 7.68 mm²
Spatial resolution120 µm
Phase & intensity sampling80 x 64
Resolution (Phase)< 6 nm RMS*
Accuracy (Absolute)< 40 nm RMS*
Real-time processing frequency10 Hz (full resolution)
InterfaceUSB 2.0
Dimensions (w x h x l)90 x 115 x 120 mm³
Weight~1.8 kg
* for coherent sources
Download
Brochure-Optical-metrology-solutions-Kaleo-products-V9.pdf
Brochure-Laser-testing-and-adaptive-optics-solutions-V10.pdf
SID4-eSWIR-Specifications-Sheet-V2.pdf