SID4 SWIR


Spectral Range SWIR (900 – 1700 nm)

The SID4 SWIR wavefront sensor integrates Phasics’ patented technology with an InGaAs detector. Thanks to its high spatial resolution (80 x 64 phase pixels) and high sensitivity, it offers accurate wavefront measurement from 900 nm to 1.7μm. The SID4 SWIR is an innovative solution for testing SWIR optical systems used in optical communications, inspection instruments or night vision in military and surveillance devices.

Key Features

  • High resolution – 80 x 64 phase pixels
  • High sensitivity – compatible with low energy IR sources
  • Compact and self-referenced for easy set-up
     

PHASICS

Spec

SID4 SWIR
ModelSID4 SWIR
Wavelength range0.9 – 1.7 µm
Aperture dimension9.60 x 7. 68 mm²
Spatial resolution120 µm
Phase & intensity sampling80 x 64
Resolution (Phase)< 2 nm RMS
Accuracy (Absolute)15 nm RMS
Acquisition rate30 fps
Real-time processing frequency*7 fps (full resolution)
Computer connectionGiga Ethernet
Dimensions (w x h x l)100 x 55 x 63 mm³
Weight~ 500 g
*with SID4 Software
Download
Brochure-Optical-metrology-solutions-Kaleo-products-V9.pdf
Brochure-Laser-testing-and-adaptive-optics-solutions-V10.pdf
SID4-SWIR-Specifications-Sheet-V3.pdf