SID4 UHR Ultra-High-Resolution wavefront sensor is adapted for optics metrology needs. It combines the SID4 ease of implementation with high sampling and resolution. Its large aperture allows to get a live wavefront measurement over the complete sample under test. The SID4 UHR is optimized for surface inspection (roughness, high frequency defects detection…) and optical components characterization (lens, objective, aspherical and freeform optics…). Built with a high-performance camera it provides incredible precision for laser characterization. The 512 x 512 phase map sampling with such compactness make the SID4 UHR a unique tool for optics and laser metrology in both research and industry fields.
| Model | SID4 UHR |
|---|---|
| Wavelength range | 400 – 1100 nm |
| Aperture dimension | 15.16 x 15.16 mm² |
| Spatial resolution | 29.6 µm |
| Phase & intensity sampling | 512 x 512 |
| Resolution (Phase) | < 2 nm RMS |
| Accuracy (Absolute) | 15 nm RMS |
| Acquisition rate | 8 fps |
| Real-time processing frequency* | 1 fps (full resolution) |
| Computer connection | Giga Ethernet |
| Dimensions (w x h x l) | 60 x 60 x 70 mm³ |
| Weight | ~450 g |
