SID4 UV-HR


Spectral Range UV (190 – 400 nm)

Phasics SID4 UV HR (ultra-violet high resolution) wavefront sensor Based on Phasics’ patented technology, the SID4 UV HR wavefront sensor offers both an unrivalled high resolution (355 x 280 measurement points) and a very high sensitivity (1 nm RMS) in the ultraviolet spectrum from 190 nm to 400 nm. Consequently, the SID4 UV HR is perfectly adapted for optical component characterization (used in lithography, semiconductors…) and surface inspection (lens and wafers…).

Key Features

  • Sensitive down to 190 nm
  • High sensitivity – 1 nm RMS
  • Very high resolution (355 x 280 sampling)

 

PHASICS

Spec

SID4 UV-HR
ModelSID4 UV-HR
Wavelength range190 – 400 nm
Aperture dimension13.84 x 10.88 mm²
Spatial resolution38.88 µm
Phase & intensity sampling355 x 280
Resolution (Phase)1 nm RMS
Accuracy (Absolute)10 nm RMS
Acquisition rate30 fps
Real-time processing frequency*3 fps (full resolution)*
Computer connectionCamera Link
Dimensions (w x h x l)78 x 88.1 x 70.8 mm³
Weight~575g
*with SID4 software
Download
Brochure-Laser-testing-and-adaptive-optics-solutions-V10.pdf
Brochure-Optical-metrology-solutions-Kaleo-products-V9.pdf
SID4-UV-HR-Specifications-Sheet-V2.pdf