Kaleo MTF Station

Spectral Range UV (190 – 400 nm) VIS – NIR (400 – 1100 nm) SWIR (900 – 1700 nm)

The Kaleo MTF instrument is ideal for measuring sets of lenses at the design, prototyping, or production phase. It delivers the most complete lens characterization: on & off-axis MTF, radiometry, and wavefront error at multiple wavelengths. The Kaleo MTF measurement accuracy remains unchanged even at high CRA and FOV.

Key Features

  • Compatible with large FOV (up to +/- 90°) and CRA (up to 50°) lenses
  • Single shot MTF and WFE measurements
  • On & off axis infinite to finite configuration

PHASICS

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Spec

Kaleo MTF Station
ModelKaleo MTF Station
MTF on-axisAccuracy <1%* – Repeatibility <0.5%*
MTF off-axisAccuracy <2%** – Repeatibility <1%**
MTF max frequency1000 lp/mm
DistortionAccuracy <0.5% – Repeatibility <0.05%
OPD (on-axis)Accuracy <20nm RMS – Repeatibility <5nm RMS
This specificaction is obtained for optics measured at 660 nm for 3 frequencies.
** This specification is given over the whole field of view.
Download
Brochure-Optical-metrology-solutions-Kaleo-products-V9.pdf
Kaleo-MTF-Specifications-sheet.pdf

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