ModelKaleo MTF StationMTF on-axisAccuracy <1%* - Repeatibility <0.5%*MTF off-axisAccuracy <2%** - Repeatibility <1%**MTF max frequency1000 lp/mmDistortionAccuracy <0.5% - Repeatibility <0.05%OPD (on-axis)Accuracy <20nm RMS - Repeatibility <5nm RMS This specificaction is obtained for optics measured at 660 nm for 3 frequencies. ** This specification is given over the whole field of view. Download Brochure-Optical-metrology-solutions-Kaleo-products-V9.pdf Kaleo-MTF-Specifications-sheet.pdf

Kaleo MTF Station | ONSET銓州光電

Name: Kaleo MTF Station
SKU: 13945
Availability: InStock

Kaleo MTF Station

Spectral Range UV (190 – 400 nm) VIS – NIR (400 – 1100 nm) SWIR (900 – 1700 nm)

The Kaleo MTF instrument is ideal for measuring sets of lenses at the design, prototyping, or production phase. It delivers the most complete lens characterization: on & off-axis MTF, radiometry, and wavefront error at multiple wavelengths. The Kaleo MTF measurement accuracy remains unchanged even at high CRA and FOV.

Key Features

Compatible with large FOV (up to +/- 90°) and CRA (up to 50°) lenses
Single shot MTF and WFE measurements
On & off axis infinite to finite configuration

PHASICS

Spec

Kaleo MTF Station

Model	Kaleo MTF Station
MTF on-axis	Accuracy <1%* – Repeatibility <0.5%*
MTF off-axis	Accuracy <2% – Repeatibility <1%
MTF max frequency	1000 lp/mm
Distortion	Accuracy <0.5% – Repeatibility <0.05%
OPD (on-axis)	Accuracy <20nm RMS – Repeatibility <5nm RMS

This specificaction is obtained for optics measured at 660 nm for 3 frequencies.
** This specification is given over the whole field of view.

Download
Brochure-Optical-metrology-solutions-Kaleo-products-V9.pdf
Kaleo-MTF-Specifications-sheet.pdf

Kaleo MTF Station

Spectral Range UV (190 – 400 nm) VIS – NIR (400 – 1100 nm) SWIR (900 – 1700 nm)

Key Features

Spec

Kaleo MTF Station

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