[ 產品資訊 ] Optical waveguide metrology and index of refraction mapping

 2025 年 2 月 11 日

Single-shot mapping of refractive index in waveguides and photonic devices Optical waveguides are largely used in photonic devices and systems, due to their low optical loss. The refractive index […]

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[ 產品資訊 ] 3D surface topography measurements

 2024 年 12 月 6 日

Easy to integrate surface topography measurement Measuring surface properties is a way to control and adjust manufacturing methods in order to improve the sample overall performance. For this type of […]

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